Cp E 432: Testing of Computing Systems
Physical defects from semiconductor manufacture, fault modeling and simulation, fault activation and detection in digital systems, digital test pattern synthesis, test coverage, test compaction, online/offline/BIST testing concepts, design-for-test, design-for- manufacture, system testability and diagnosability.
- El E 351: Electronics Circuits I
- El E 385: Advanced Digital Systems
- El E 386: Advanced Digital Systems Laboratory
- Lecture: Lecture for Cp E 432
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