Cp E 432: Testing of Computing Systems
Electrical Engineering
Physical defects from semiconductor manufacture, fault modeling and simulation, fault activation and detection in digital systems, digital test pattern synthesis, test coverage, test compaction, online/offline/BIST testing concepts, design-for-test, design-for- manufacture, system testability and diagnosability.
3 Credits
Prerequisites
- El E 351: Electronics Circuits I
- El E 385: Advanced Digital Systems
- El E 386: Advanced Digital Systems Laboratory
Instruction Type(s)
- Lecture: Lecture for Cp E 432
Subject Areas
The policies and regulations contained in this online University of Mississippi Catalog are in effect for the current or selected semester. The catalog is not a contract, but rather a guide for the convenience of students. The University of Mississippi reserves the right to 1) change or withdraw courses; 2) change the fees, rules, and schedules for admission, registration, instruction, and graduation; and 3) change other regulations affecting the student body at any time. Implicit in each student’s enrollment with the university is an agreement to comply with university rules and regulations, which the university may modify to exercise properly its educational responsibility.