Cp E 432: Testing of Computing Systems
ELECTRICAL ENGINEERING
Physical defects from semiconductor manufacture, fault modeling and simulation, fault activation and detection in digital systems, digital test pattern synthesis, test coverage, test compaction, online/offline/BIST testing concepts, design-for-test, design-for- manufacture, system testability and diagnosability.
3 Credits
Prerequisites
- El E 351: Models and Circuits I
- El E 385: Advanced Digital Systems
- El E 386: Advanced Digital Systems Laboratory
Instruction Type(s)
- Lecture: Lecture for Cp E 432
Subject Areas
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